Conference contribution
(Conference Contribution)


Automatic Graph-based Success Tree Construction and Analysis


Publication Details
Author(s): Aliee H, Glaß M, Wanka R, Teich J
Title edited volumes: Proceedings - Annual Reliability and Maintainability Symposium
Publication year: 2014
Conference Proceedings Title: Proc. 60th Annual Reliability and Maintainability Symposium (RAMS)
Pages range: 563-569
ISSN: 0149-144X

Event details
Event: Annual Reliability and Maintainability Symposium (RAMS)
Event location: Colorado Springs, Colorado, USA
Start date of the event: 27/01/2014
End date of the event: 30/01/2014
Language: English

Abstract

This paper presents a graph-based representation of success trees to evaluate the reliability of an embedded system. First, a success tree is constructed by deriving a characteristic function from a graph-based system model automatically. The constructed success tree is then translated to a graph (called a success graph) which supports both cyclic and acyclic data dependencies in applications to be mapped to the system resources and analyzed for reliability. To analyze the success graph, an algorithm called 0-propagation is introduced which propagates errors through the graph. The system fails if the errors propagate to the output of the success graph. Experimental results show that the proposed technique can simply and efficiently construct and analyze success trees of real-life embedded systems in a short time with negligible inaccuracy which suits well for evaluating the reliability of complex systems, e. g., as part of a design space exploration. © 2014 IEEE.



How to cite
APA: Aliee, H., Glaß, M., Wanka, R., & Teich, J. (2014). Automatic Graph-based Success Tree Construction and Analysis. In Proc. 60th Annual Reliability and Maintainability Symposium (RAMS) (pp. 563-569).

MLA: Aliee, Hananeh, et al. "Automatic Graph-based Success Tree Construction and Analysis." Proceedings of the Annual Reliability and Maintainability Symposium (RAMS), Colorado Springs, Colorado, USA 2014. 563-569.

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