Conference contribution
(Conference Contribution)


Electromagnetic Analysis of Fringed Microstrip Lines on Porosified LTCC


Publication Details
Author(s): Talai A, Steinhäußer F, Gmeiner B, Bittner A, Rüde U, Schmid U, Weigel R, Kölpin A
Title edited volumes: Proceedings of the 2013 International Conference on Electromagnetics in Advanced Applications, ICEAA 2013
Publication year: 2013
Conference Proceedings Title: Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Pages range: 1189-1192

Event details
Event: International Conference on Electromagnetics in Advanced Applications (ICEAA)
Event location: Torino, Italy
Start date of the event: 09/09/2013
End date of the event: 13/09/2013

Abstract

Recent investigations demonstrated that porosification of LTCC enables a local modification of material properties, in particular of the effective permittivity. These studies revealed that the electric field strength is highest at the lower conductor track edges on the porosified substrate. The local field strength peaks cause substantial influence on the effectiveness of permittivity reduction due near-surface material abrasions. In this paper, the influences of these randomly fringed boundaries on electromagnetic properties are investigated for different degrees of fraying. The gained results are compared to measured screen print edges by scanning electron microscope image analysis of co-fired and post-fired gold conductors, and will contribute for reliable circuit design on porous LTCC in the future. © 2013 IEEE.



Focus Area of Individual Faculties


How to cite
APA: Talai, A., Steinhäußer, F., Gmeiner, B., Bittner, A., Rüde, U., Schmid, U.,... Kölpin, A. (2013). Electromagnetic Analysis of Fringed Microstrip Lines on Porosified LTCC. In Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on (pp. 1189-1192).

MLA: Talai, Armin, et al. "Electromagnetic Analysis of Fringed Microstrip Lines on Porosified LTCC." Proceedings of the International Conference on Electromagnetics in Advanced Applications (ICEAA), Torino, Italy 2013. 1189-1192.

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