Conference contribution


Cross-Layer Dependability Modeling and Abstraction in System on Chip


Publication Details
Author(s): Herkersdorf A, Engel M, Glaß M, Henkel J, Kleeberger VB, Kochte MA, Kühn JM, Nassif SR, Rauchfuss H, Rosenstiel W, Schlichtmann U, Shafique M, Tahoori MB, Teich J, Wehn N, Weis C, Wunderlich HJ
Publisher: Elsevier
Publishing place: München
Publication year: 2013
Conference Proceedings Title: Proc. 9th Workshop on Silicon Errors in Logic - System Effects
Pages range: 1-7
ISSN: 0026-2714

Event details
Event: 9th Workshop on Silicon Errors in Logic - System Effects (SELSE)
Event location: Palo Alto, CA
Start date of the event: 26/03/2013
End date of the event: 27/03/2013



How to cite
APA: Herkersdorf, A., Engel, M., Glaß, M., Henkel, J., Kleeberger, V.B., Kochte, M.A.,... Wunderlich, H.J. (2013). Cross-Layer Dependability Modeling and Abstraction in System on Chip. In Proc. 9th Workshop on Silicon Errors in Logic - System Effects (pp. 1-7). München: Elsevier.

MLA: Herkersdorf, Andreas, et al. "Cross-Layer Dependability Modeling and Abstraction in System on Chip." Proceedings of the 9th Workshop on Silicon Errors in Logic - System Effects (SELSE), Palo Alto, CA München: Elsevier, 2013. 1-7.

BibTeX: Download
Share link
Last updated on 2017-05-29 at 02:51
PDF downloaded successfully