Conference contribution


Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience


Publication Details
Author(s): Hoffmann M, Dietrich C, Lohmann D
Publication year: 2013
Conference Proceedings Title: Proceedings of the 2nd GI Workshop on Software-Based Methods for Robust Embedded Systems (SOBRES '13)
Pages range: -
Event: Informatik 2013
Event location: Koblenz, Germany



How to cite
APA: Hoffmann, M., Dietrich, C., & Lohmann, D. (2013). Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience. In Proceedings of the 2nd GI Workshop on Software-Based Methods for Robust Embedded Systems (SOBRES '13) (pp. -).

MLA: Hoffmann, Martin, Christian Dietrich, and Daniel Lohmann. "Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience." Proceedings of the Informatik 2013, Koblenz, Germany 2013. -.

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