Phase Measuring Deflectometry: a new approuch to measure specular free-form surfaces

Häusler G (2004)

Publication Type: Journal article

Publication year: 2004

Journal

Proceedings of SPIE Society of Photo-optical Instrumentation Engineers (SPIE)

Book Volume: 5458

Pages Range: 366-376

Authors with CRIS profile

Gerd Häusler Lehrstuhl für Experimentalphysik (Optik)

How to cite

APA:

Häusler, G. (2004). Phase Measuring Deflectometry: a new approuch to measure specular free-form surfaces. Proceedings of SPIE, 5458, 366-376.

MLA:

Häusler, Gerd. "Phase Measuring Deflectometry: a new approuch to measure specular free-form surfaces." Proceedings of SPIE 5458 (2004): 366-376.

BibTeX: Download