Hahn T, Schüll D, Wildermann S, Teich J (2024)
Publication Language: English
Publication Type: Conference contribution, Conference Contribution
Publication year: 2024
Conference Proceedings Title: IEEE Proceedings of the 27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
Event location: Kielce
Big Data applications frequently process data streams encoded in semi-structured data formats such as JSON, Protobuf, or Avro.
Parsing these data formats into a representation to then be processed by a CPU frequently takes up a major share of the processing time.
As a remedy, JSON and Avro FPGA accelerators have been introduced that can parse the data directly in the data path, offloading this workload from the CPU without requiring any additional data movement.
However, these accelerators are schema-specific circuits that require time-consuming resynthesis processes for schema adaptations.
This is particularly critical in Big Data applications, where multiple schemas may be in use simultaneously.
As a remedy, we present an application-specific instruction set processor (ASIP) architecture for parsing Avro data on FPGAs.
An instruction program controls the ASIP to parse a specific schema.
Any schema change therefore only requires the loading of a new instruction sequence into an instruction memory.
It is also shown that this approach is more resource-efficient than related work, as functional units only need to be instantiated once for each Avro data type.
Our experimental evaluation shows that we can achieve a throughput of 707-818 MB/s per kLUT which is about 7 to 14 times higher than the throughput per LUT achieved in related work.
APA:
Hahn, T., Schüll, D., Wildermann, S., & Teich, J. (2024). ABACUS: ASIP-based Avro Schema-customizable Parser Acceleration on FPGAs. In IEEE Proceedings of the 27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Kielce.
MLA:
Hahn, Tobias, et al. "ABACUS: ASIP-based Avro Schema-customizable Parser Acceleration on FPGAs." Proceedings of the International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Kielce 2024.
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