Structural analysis of direct laser written waveguides
Salter PS, Jesacher A, Huang L, Liu X, Baum M, Alexeev I, Schmidt M, Booth MJ (2014)
Publication Type: Conference contribution
Publication year: 2014
Journal
Publisher: SPIE
Book Volume: 8968
Conference Proceedings Title: Proceedings of SPIE - The International Society for Optical Engineering
Event location: USA
ISBN: 9780819498816
DOI: 10.1117/12.2040422
Abstract
We perform structural characterisation of direct laser write (DLW) waveguides. Quantitative phase microscopy, based on solution of the transfer of intensity equation, is used to measure the cumulative refractive index change through a waveguide perpendicular to its axis. Results are compared with interferometry, cross-sectional measurements using third harmonic microscopy, and analysis of the near-field image of the mode propagating in the waveguide. We show that in many situations, notably in the presence of depth dependent spherical aberrations, the cross-section for DLW waveguides may not be assumed symmetric about the waveguide axis. This is particularly important when fabricating at depths greater than 2 mm in fused silica. Therefore additional measurements are required to fully characterise the refractive index profile. © 2014 SPIE.
Authors with CRIS profile
Marcus Baum
Lehrstuhl für Photonische Technologien
Ilya Alexeev
Lehrstuhl für Photonische Technologien
Michael Schmidt
Lehrstuhl für Photonische Technologien
Involved external institutions
United Kingdom (GB)
Austria (AT)How to cite
APA:
Salter, P.S., Jesacher, A., Huang, L., Liu, X., Baum, M., Alexeev, I.,... Booth, M.J. (2014). Structural analysis of direct laser written waveguides. In Proceedings of SPIE - The International Society for Optical Engineering. USA: SPIE.
MLA:
Salter, P. S., et al. "Structural analysis of direct laser written waveguides." Proceedings of the Laser-Based Micro- and Nanoprocessing VIII, USA SPIE, 2014.
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