Imaging the field profile inside dielectric laser acceleration nanostructures

Fishman T, Häusler U, Dahan R, Yannai M, Adiv Y, Abudy TL, Eyal O, Yousefi P, Shiloh R, Eisenstein G, Hommelhoff P, Kaminer I (2022)

Publication Type: Conference contribution

Publication year: 2022

Publisher: Optica Publishing Group (formerly OSA)

Conference Proceedings Title: Optics InfoBase Conference Papers

Event location: San Jose, CA, USA

ISBN: 9781557528209

Abstract

We present deep sub-wavelength measurement of the field distribution inside nanophotonic dielectric laser accelerator structures, using photon-induced nearfield electron microscopy. Comparing the measured field with theory provides new insight into accelerators' performance and structural sensitivity.

Authors with CRIS profile

Peyman Yousefi Lehrstuhl für Laserphysik Roy Shiloh Lehrstuhl für Laserphysik Peter Hommelhoff Lehrstuhl für Laserphysik

Involved external institutions

Technion - Israel Institute of Technology IL Israel (IL)

How to cite

APA:

Fishman, T., Häusler, U., Dahan, R., Yannai, M., Adiv, Y., Abudy, T.L.,... Kaminer, I. (2022). Imaging the field profile inside dielectric laser acceleration nanostructures. In Optics InfoBase Conference Papers. San Jose, CA, USA: Optica Publishing Group (formerly OSA).

MLA:

Fishman, Tal, et al. "Imaging the field profile inside dielectric laser acceleration nanostructures." Proceedings of the CLEO: Science and Innovations, S and I 2022, San Jose, CA, USA Optica Publishing Group (formerly OSA), 2022.

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