Influence of the parasitic series inductance of the coupling capacitor of a SEPIC to the coil current waveforms with coupled inductors
Laugner M, Eberle T (2022)
Publication Type: Conference contribution
Publication year: 2022
Publisher: Institute of Electrical and Electronics Engineers Inc.
Book Volume: 2022-June
Pages Range: 540-545
Conference Proceedings Title: IEEE International Symposium on Industrial Electronics
Event location: Anchorage, AK
ISBN: 9781665482400
DOI: 10.1109/ISIE51582.2022.9831669
Abstract
A previously neglected effect when using coupled inductors in the SEPIC is considered. It is based on the interaction of the leakage inductance with the series inductance of the coupling capacitor. This effect is evident in sudden changes of the inductor currents during the switching processes, increases the electromagnetic interferences and decreases the efficiency of the converter. The theoretical analysis shows significant impacts, especially for closely coupled inductors. The impact and therefore the filter effort can be significantly reduced by optimizing the components and the PCB-layout. The effect is verified by means of LTSpice simulations and experimental measurements of a hardware setup. It is directly transferable to other higher-order converters.
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How to cite
APA:
Laugner, M., & Eberle, T. (2022). Influence of the parasitic series inductance of the coupling capacitor of a SEPIC to the coil current waveforms with coupled inductors. In Manuel Laugner, Thomas Eberle (Eds.), IEEE International Symposium on Industrial Electronics (pp. 540-545). Anchorage, AK, US: Institute of Electrical and Electronics Engineers Inc..
MLA:
Laugner, Manuel, and Thomas Eberle. "Influence of the parasitic series inductance of the coupling capacitor of a SEPIC to the coil current waveforms with coupled inductors." Proceedings of the 31st IEEE International Symposium on Industrial Electronics, ISIE 2022, Anchorage, AK Ed. Manuel Laugner, Thomas Eberle, Institute of Electrical and Electronics Engineers Inc., 2022. 540-545.
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