Switching Loss Measurement-A Thermal Approach Applied to GaN-Half-Bridge Configuration

Kohlhepp B, Kübrich D, Dürbaum T (2021)

Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2021

Publisher: Institute of Electrical and Electronics Engineers Inc.

ISBN: 9789075815375

URI: https://www.scopus.com/record/display.uri?eid=2-s2.0-85119039332&origin=inward

Authors with CRIS profile

Benedikt Kohlhepp Professur für Optoelektronik Daniel Kübrich Professur für Optoelektronik Thomas Dürbaum Professur für Elektromagnetische Felder

How to cite

APA:

Kohlhepp, B., Kübrich, D., & Dürbaum, T. (2021). Switching Loss Measurement-A Thermal Approach Applied to GaN-Half-Bridge Configuration. In Proceedings of the 23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe. Institute of Electrical and Electronics Engineers Inc..

MLA:

Kohlhepp, Benedikt, Daniel Kübrich, and Thomas Dürbaum. "Switching Loss Measurement-A Thermal Approach Applied to GaN-Half-Bridge Configuration." Proceedings of the 23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe Institute of Electrical and Electronics Engineers Inc., 2021.

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