An Atom Probe with Ultra-Low Hydrogen Background

Felfer P, Ott B, Monajem M, Dalbauer V, Heller M, Josten J, Macaulay C (2021)


Publication Type: Journal article

Publication year: 2021

Journal

DOI: 10.1017/S1431927621013702

Abstract

Atom probe tomography (APT) is a single-ion sensitive time-of-flight mass spectrometry method with near-atomic spatial resolution. In principle, it can be used to detect any chemical element, but so far hydrogen in the form of protium (H-1) had to be largely excluded. This is owing to the residual H emitted from the stainless-steel chambers and in-vacuum parts commonly used in atom probe instrumentation. This residual H is then picked up in the APT experiment. In this paper, we show that by replacing the stainless-steel chamber and in-vacuum parts with titanium parts, this residual H can largely be removed, thus enabling the direct imaging of H using APT. We show that besides the drastic reduction of H, also other contaminants such as O, OH, and H2O are reduced by employing this instrument. In the current set-up, the instrument is equipped with high-voltage pulsing limiting the application to conductive materials.

Authors with CRIS profile

How to cite

APA:

Felfer, P., Ott, B., Monajem, M., Dalbauer, V., Heller, M., Josten, J., & Macaulay, C. (2021). An Atom Probe with Ultra-Low Hydrogen Background. Microscopy and Microanalysis. https://dx.doi.org/10.1017/S1431927621013702

MLA:

Felfer, Peter, et al. "An Atom Probe with Ultra-Low Hydrogen Background." Microscopy and Microanalysis (2021).

BibTeX: Download