Validation of Chinese Version of SKT (Syndrom Kurztest): A Short Cognitive Performance Test for the Assessment of Memory and Attention

Lu Y, Hu J, Stemmler M, Guo Q (2021)

Publication Language: English

Publication Type: Journal article, Original article

Publication year: 2021

Journal

Diagnostics MDPI

Book Volume: 11(12)

Pages Range: 2253

DOI: 10.3390/diagnostics11122253

Open Access Link: https://doi.org/10.3390/diagnostics11122253

Authors with CRIS profile

Mark Stemmler Lehrstuhl für Psychologische Diagnostik, Methodenlehre und Rechtspsychologie

Involved external institutions

Shanghai Jiao Tong University / 上海交通大学 CN China (CN)

How to cite

APA:

Lu, Y., Hu, J., Stemmler, M., & Guo, Q. (2021). Validation of Chinese Version of SKT (Syndrom Kurztest): A Short Cognitive Performance Test for the Assessment of Memory and Attention. Diagnostics, 11(12), 2253. https://dx.doi.org/10.3390/diagnostics11122253

MLA:

Lu, Yao, et al. "Validation of Chinese Version of SKT (Syndrom Kurztest): A Short Cognitive Performance Test for the Assessment of Memory and Attention." Diagnostics 11(12) (2021): 2253.

BibTeX: Download