Determination of the yield, mass and structure of silver patches on colloidal silica using multiwavelength analytical ultracentrifugation

Meincke T, Walter J, Pflug L, Thajudeen T, Völkl A, Cardenas Lopez P, Uttinger M, Stingl M, Watanabe S, Peukert W, Klupp Taylor R (2022)

Publication Language: English

Publication Type: Journal article, Original article

Publication year: 2022

Journal

Journal of Colloid and Interface Science Elsevier

Book Volume: 607

Pages Range: 698-710

Journal Issue: 1

URI: https://www.researchgate.net/publication/354270035_Determination_of_the_yield_mass_and_structure_of_silver_patches_on_colloidal_silica_using_multiwavelength_analytical_ultracentrifugation

DOI: 10.1016/j.jcis.2021.08.161

Abstract

Anisotropic nanoparticles offer considerable promise for applications but also present significant challenges in terms of their characterization. Recent developments in the electroless deposition of silver patches directly onto colloidal silica particles have opened up a simple and scalable synthesis method for patchy particles with tunable optical properties. Due to the reliance on patch nucleation and growth, however, the resulting coatings are distributed in coverage and thickness and some core particles remain uncoated. To support process optimization, new methods are required to rapidly determine patch yield, thickness and coverage. Here we present a novel approach based on multiwavelength analytical ultracentrifugation (MWL-AUC) which permits simultaneous hydrodynamic and spectroscopic characterization. The patchy particle colloids are produced in a continuous flow mixing process that makes use of a KM-type micromixer. By varying the process flow rate or metal precursor concentration we show how the silver to silica mass ratio distribution derived from the AUC-measured sedimentation coefficient distribution can be influenced. Moreover, through reasoned assumptions we arrive at an estimation of the patch yield that is close to that determined by arduous analysis of scanning electron microscopy (SEM) images. Finally, combining MWL-AUC, electrodynamic simulations and SEM image analysis we establish a procedure to estimate the patch thickness and coverage.

Authors with CRIS profile

Thomas Meincke Professur für Nanostructured Particles Johannes Walter Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik Lukas Pflug FAU Competence Center Scientific Computing (FAU CSC) Andreas Völkl Professur für Nanostructured Particles Paola Cardenas Lopez Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik Maximilian Uttinger Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik Michael Stingl Lehrstuhl für Angewandte Mathematik (Kontinuierliche Optimierung) Wolfgang Peukert Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik Robin Klupp Taylor Professur für Nanostructured Particles

Related research project(s)

Multidimensional characterisation of nanoparticle ensembles (SFB 1411 - C04) Design of particulate products (SFB 1411) Jan. 1, 2020 - Dec. 31, 2023 Continuous flow synthesis of patchy particles with designed resonances and interactions (SFB 1411 - A03) Design of particulate products (SFB 1411) Jan. 1, 2020 - Jan. 1, 2023

Involved external institutions

Indian Institute of Technology Goa IN India (IN) Kyoto University / 京都大学 Kyōto daigaku JP Japan (JP)

How to cite

APA:

Meincke, T., Walter, J., Pflug, L., Thajudeen, T., Völkl, A., Cardenas Lopez, P.,... Klupp Taylor, R. (2022). Determination of the yield, mass and structure of silver patches on colloidal silica using multiwavelength analytical ultracentrifugation. Journal of Colloid and Interface Science, 607(1), 698-710. https://dx.doi.org/10.1016/j.jcis.2021.08.161

MLA:

Meincke, Thomas, et al. "Determination of the yield, mass and structure of silver patches on colloidal silica using multiwavelength analytical ultracentrifugation." Journal of Colloid and Interface Science 607.1 (2022): 698-710.

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