Strobl C, Rabenstein R (2021)
Publication Language: English
Publication Type: Conference contribution
Publication year: 2021
City/Town: USA (Online-Veranstaltung)
Pages Range: 8 Seiten
Conference Proceedings Title: 2021 IEEE 4th International Conference on DC Microgrids (ICDCM)
Event location: Online-Veranstaltung
DOI: 10.1109/icdcm50975.2021.9504621
For the purpose of refined fault detection in DC grids, linear models of components, of cabling as well as of possible faults can be applied in order to model the first milliseconds after a possible sudden event. Using a semi-analytical model, a factorial analysis of signals at voltage and current sensors is set up – specific signal patterns representing either fault events or changes between normal operation modes are estimated. With these results, refined fault detection methods avoiding false tripping can be implemented and parametrized.
APA:
Strobl, C., & Rabenstein, R. (2021). Linearized System and Fault Modeling Methods for {DC}-Grids Including Factorial Analysis. In 2021 IEEE 4th International Conference on DC Microgrids (ICDCM) (pp. 8 Seiten). Online-Veranstaltung, US: USA (Online-Veranstaltung).
MLA:
Strobl, Christian, and Rudolf Rabenstein. "Linearized System and Fault Modeling Methods for {DC}-Grids Including Factorial Analysis." Proceedings of the 4th International Conference on DC Microgrids (ICDCM), Online-Veranstaltung USA (Online-Veranstaltung), 2021. 8 Seiten.
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