Normally off Vertical 3-D GaN Nanowire MOSFETs with Inverted p-GaN Channel

Yu F, Strempel K, Fatahilah MF, Zhou H, Roemer F, Bakin A, Witzigmann B, Schumacher HW, Wasisto HS, Waag A (2018)


Publication Type: Journal article

Publication year: 2018

Journal

Book Volume: 65

Pages Range: 2439-2445

Journal Issue: 6

DOI: 10.1109/TED.2018.2824985

Abstract

This paper reports on the normally off GaN vertical MOSFETs based on nanowires (NWs) with an inverted p-GaN channel and a wrap-around-gate structure for the first time. Both inductively coupled plasma dry reactive-ion etching and wet-chemical etching were employed to fabricate the vertically aligned GaN NWs from epitaxial thin films with a specified doping profile. During the wet etching, the influence of p-doping on the NW morphology was investigated, and the results could be explained by the proposed model. In comparison with other c-axis NW transistors, an enhancement-mode (E-mode) operation with a superior threshold voltage ( V-th ) of 2.5 V has been reached in the fabricated GaN MOSFETs. Furthermore, a high driving-current density of 101 kA/cm2 as well as a high ON-/OFF-current ratio of 109 was obtained in the NWs, predicting a potential approach toward future GaN electronics with vertical and smart architecture.

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APA:

Yu, F., Strempel, K., Fatahilah, M.F., Zhou, H., Roemer, F., Bakin, A.,... Waag, A. (2018). Normally off Vertical 3-D GaN Nanowire MOSFETs with Inverted p-GaN Channel. IEEE Transactions on Electron Devices, 65(6), 2439-2445. https://dx.doi.org/10.1109/TED.2018.2824985

MLA:

Yu, Feng, et al. "Normally off Vertical 3-D GaN Nanowire MOSFETs with Inverted p-GaN Channel." IEEE Transactions on Electron Devices 65.6 (2018): 2439-2445.

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