Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*

Bosio A, O'Connor I, Traiola M, Echavarria Gutiérrez JA, Teich J, Abdullah Hanif M, Shafique M, Hamdioui S, Deveautour B, Girard P, Virazel A, Bertels K (2021)

Publication Language: English

Publication Type: Conference contribution, Original article

Publication year: 2021

Publisher: IEEE

Conference Proceedings Title: Proceedings of the 26th IEEE European Test Symposium (ETS)

Event location: Virtual Conference BE

DOI: 10.1109/ETS50041.2021.9465409

Authors with CRIS profile

Jorge Alfonso Echavarria Gutiérrez Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design) Jürgen Teich Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)

Related research project(s)

None - None

Involved external institutions

Delft University of Technology (TU Delft) NL Netherlands (NL) Université de Lyon (UDL) FR France (FR) Karlsruhe Institute of Technology (KIT) DE Germany (DE)

How to cite

APA:

Bosio, A., O'Connor, I., Traiola, M., Echavarria Gutiérrez, J.A., Teich, J., Abdullah Hanif, M.,... Bertels, K. (2021). Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*. In Proceedings of the 26th IEEE European Test Symposium (ETS). Virtual Conference, BE: IEEE.

MLA:

Bosio, Alberto, et al. "Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*." Proceedings of the IEEE European Test Symposium (ETS), Virtual Conference IEEE, 2021.

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