A versatile cryo-transfer system, connecting cryogenic focused ion beam sample preparation to atom probe microscopy

Macauley C, Heller M, Rausch A, Kümmel F, Felfer P (2021)

Publication Type: Journal article

Publication year: 2021

Journal

PLoS ONE Public Library of Science

Book Volume: 16

Article Number: e0245555

Journal Issue: 1 January

DOI: 10.1371/journal.pone.0245555

Abstract

Atom probe tomography (APT) is a powerful technique to obtain 3D chemical and structural information, however the ‘standard’ atom probe experimental workflow involves transfer of specimens at ambient conditions. The ability to transfer air- or thermally-sensitive samples between instruments while maintaining environmental control is critical to prevent chemical or morphological changes prior to analysis for a variety of interesting sample materials. In this article, we describe a versatile transfer system that enables cryogenic- or room-temperature transfer of specimens in vacuum or atmospheric conditions between sample preparation stations, a focused ion beam system (Zeiss Crossbeam 540) and a widely used commercial atom probe system (CAMECA LEAP 4000X HR). As an example for the use of this transfer system, we present atom probe data of gallium- (Ga)-free grain boundaries in an aluminum (Al) alloy specimen prepared with a Ga-based FIB.

Authors with CRIS profile

Chandra Macauley Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften) Martina Heller Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften) Frank Kümmel Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften) Peter Felfer Professur für Atom Probe Tomography

Additional Organisation(s)

Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)

Related research project(s)

In-situ nanomechanics and FIB tomography of thin films (EXC315 EAM (A2-3)) Exzellenz-Cluster Engineering of Advanced Materials Nov. 1, 2012 - Oct. 31, 2017

How to cite

APA:

Macauley, C., Heller, M., Rausch, A., Kümmel, F., & Felfer, P. (2021). A versatile cryo-transfer system, connecting cryogenic focused ion beam sample preparation to atom probe microscopy. PLoS ONE, 16(1 January). https://dx.doi.org/10.1371/journal.pone.0245555

MLA:

Macauley, Chandra, et al. "A versatile cryo-transfer system, connecting cryogenic focused ion beam sample preparation to atom probe microscopy." PLoS ONE 16.1 January (2021).

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