Soft x-ray microscopy with 7 nm resolution

Roesner B, Finizio S, Koch F, Doring F, Guzenko VA, Langer M, Kirk E, Watts B, Meyer M, Lorona Ornelas J, Späth A, Stanescu S, Swaraj S, Belkhou R, Ishikawa T, Keller TF, Gross B, Poggio M, Fink R, Raabe J, Kleibert A, David C (2020)

Publication Type: Journal article

Publication year: 2020

Journal

Book Volume: 7

Pages Range: 1602-1608

Journal Issue: 11

DOI: 10.1364/OPTICA.399885

Abstract

The availability of intense soft x-ray beams with tunable energy and polarization has pushed the development of highly sensitive, element-specific, and noninvasive microscopy techniques to investigate condensed matter with high spatial and temporal resolution. The short wavelengths of soft x-rays promise to reach spatial resolutions in the deep single-digit nanometer regime, providing unprecedented access to magnetic phenomena at fundamental length scales. Despite considerable efforts in soft x-ray microscopy techniques, a two-dimensional resolution of 10 nm has not yet been surpassed in direct imaging. Here, we report on a significant step beyond this long-standing limit by combining newly developed soft x-ray Fresnel zone plate lenses with advanced precision in scanning control and careful optical design. With this approach, we achieve an image resolution of 7 nm. By combining this highly precise microscopy technique with the x-ray magnetic circular dichroism effect, we reveal dimensionality effects in an ensemble of interacting magnetic nanoparticles. Such effects are topical in current nanomagnetism research and highlight the opportunities of high-resolution soft x-ray microscopy in magnetism research and beyond. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

Authors with CRIS profile

Involved external institutions

Paul Scherrer Institute (PSI) Switzerland (CH) Universität Basel Switzerland (CH) Synchrotron SOLEIL France (FR) Deutsches Elektronen-Synchrotron DESY Germany (DE) Eidgenössische Technische Hochschule Zürich (ETHZ) / Swiss Federal Institute of Technology in Zurich Switzerland (CH)

How to cite

APA:

Roesner, B., Finizio, S., Koch, F., Doring, F., Guzenko, V.A., Langer, M.,... David, C. (2020). Soft x-ray microscopy with 7 nm resolution. Optica, 7(11), 1602-1608. https://dx.doi.org/10.1364/OPTICA.399885

MLA:

Roesner, Benedikt, et al. "Soft x-ray microscopy with 7 nm resolution." Optica 7.11 (2020): 1602-1608.

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