Joint Super-Resolution and Rectification for Solar Cell Inspection

Hoffmann M, Köhler T, Doll B, Schebesch F, Talkenberg F, Peters IM, Brabec C, Maier A, Christlein V (2021)

Publication Language: English

Publication Status: In review

Publication Type: Journal article, Original article

Future Publication Type: Journal article

Publication year: 2021

Journal

IEEE Journal of Photovoltaics Institute of Electrical and Electronics Engineers (IEEE)

Book Volume: 11

Pages Range: 1051-1058

Journal Issue: 4

URI: https://arxiv.org/pdf/2011.05003.pdf

DOI: 10.1109/JPHOTOV.2021.3072229

Open Access Link: https://ieeexplore.ieee.org/document/9422363

Abstract

Visual inspection of solar modules is an important monitoring facility in photovoltaic power plants. Since a single measurement of fast CMOS sensors is limited in spatial resolution and often not sufficient to reliably detect small defects, we apply multi-frame super-resolution (MFSR) to a sequence of low resolution measurements. In addition, the rectification and removal of lens distortion simplifies subsequent analysis. Therefore, we propose to fuse this pre-processing with standard MFSR algorithms. This is advantageous, because we omit a separate processing step, the motion estimation becomes more stable and the spacing of high-resolution (HR) pixels on the rectified module image becomes uniform w.r.t. the module plane, regardless of perspective distortion. We present a comprehensive user study showing that MFSR is beneficial for defect recognition by human experts and that the proposed method performs better than the state of the art. Furthermore, we apply automated crack segmentation and show that the proposed method performs 3x better than bicubic upsampling and 2x better than the state of the art for automated inspection.

Authors with CRIS profile

Mathis Hoffmann Lehrstuhl für Informatik 5 (Mustererkennung) Thomas Köhler Lehrstuhl für Informatik 14 (Bild- und Sprachverarbeitung) Bernd Doll Institute Materials for Electronics and Energy Technology (i-MEET) Frank Schebesch Lehrstuhl für Informatik 14 (Bild- und Sprachverarbeitung) Christoph Brabec Institute Materials for Electronics and Energy Technology (i-MEET) Andreas Maier Lehrstuhl für Informatik 5 (Mustererkennung) Vincent Christlein Lehrstuhl für Informatik 5 (Mustererkennung)

Related research project(s)

Laboranalyse von Degradationsmechanismen unter beschleunigter Alterung und Entwicklung geeigneter feldtauglicher bildgebender Detektionsverfahren und Entwicklung und Evaluation eines Algorithmus zur Fehlerdetektion und Prognostizierung der Ausfallwahrscheinlichkeit (iPV4.0) Aug. 1, 2018 - July 31, 2021

Involved external institutions

Forschungszentrum Jülich / Research Centre Jülich (FZJ) DE Germany (DE)

How to cite

APA:

Hoffmann, M., Köhler, T., Doll, B., Schebesch, F., Talkenberg, F., Peters, I.M.,... Christlein, V. (2021). Joint Super-Resolution and Rectification for Solar Cell Inspection. IEEE Journal of Photovoltaics, 11(4), 1051-1058. https://dx.doi.org/10.1109/JPHOTOV.2021.3072229

MLA:

Hoffmann, Mathis, et al. "Joint Super-Resolution and Rectification for Solar Cell Inspection." IEEE Journal of Photovoltaics 11.4 (2021): 1051-1058.

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