Optimizing Multi-State Reliability in ReRAM Arrays using an Automated Device Selection Method

Peschel J, Knödtel J, Pérez E, Reichenbach M, Wenger C, Fey D (2019)

Publication Language: English

Publication Type: Conference contribution, Abstract of lecture

Publication year: 2019

Pages Range: 45

Event location: International Congress Center Dresden

Authors with CRIS profile

Johannes Knödtel Department Informatik Marc Reichenbach Lehrstuhl für Informatik 3 (Rechnerarchitektur) Dietmar Fey Lehrstuhl für Informatik 3 (Rechnerarchitektur)

How to cite

APA:

Peschel, J., Knödtel, J., Pérez, E., Reichenbach, M., Wenger, C., & Fey, D. (2019). Optimizing Multi-State Reliability in ReRAM Arrays using an Automated Device Selection Method. Paper presentation at MEMRISYS 2019 International Conference on Memristive Materials, Devices & Systems, International Congress Center Dresden.

MLA:

Peschel, Jakob, et al. "Optimizing Multi-State Reliability in ReRAM Arrays using an Automated Device Selection Method." Presented at MEMRISYS 2019 International Conference on Memristive Materials, Devices & Systems, International Congress Center Dresden 2019.

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