Wolf A, Schuster M, Ludwig V, Anton G, Funk S (2020)
Publication Type: Journal article
Publication year: 2020
Book Volume: 28
Pages Range: 13553-13568
Journal Issue: 9
DOI: 10.1364/OE.380940
The combination of grating-based phase-contrast imaging with X-ray microscopy can result in a complicated image formation. Generally, transverse shifts of the interference fringes are nonlinearly dependent on phase differences of the measured wave front. We present an iterative reconstruction scheme based on a regularized maximum likelihood cost function that fully takes this dependency into account. The scheme is validated by numerical simulations. It is particularly advantageous at low photon numbers and when the premises for deconvolution-based reconstructions are not met. Our reconstruction scheme hence enables a broader applicability of X-ray grating interferometry in imaging and wave front sensing.
APA:
Wolf, A., Schuster, M., Ludwig, V., Anton, G., & Funk, S. (2020). Maximum likelihood reconstruction for grating-based X-ray microscopy. Optics Express, 28(9), 13553-13568. https://dx.doi.org/10.1364/OE.380940
MLA:
Wolf, Andreas, et al. "Maximum likelihood reconstruction for grating-based X-ray microscopy." Optics Express 28.9 (2020): 13553-13568.
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