Mechanical cleaning of graphene using in situ electron microscopy

Schweizer P, Dolle C, Dasler D, Abellán G, Hauke F, Hirsch A, Spiecker E (2020)

Publication Type: Journal article

Publication year: 2020

Journal

Nature Communications Nature Publishing Group: Nature Communications

Book Volume: 11

Pages Range: 1743-

Journal Issue: 1

DOI: 10.1038/s41467-020-15255-3

Abstract

Avoiding and removing surface contamination is a crucial task when handling specimens in any scientific experiment. This is especially true for two-dimensional materials such as graphene, which are extraordinarily affected by contamination due to their large surface area. While many efforts have been made to reduce and remove contamination from such surfaces, the issue is far from resolved. Here we report on an in situ mechanical cleaning method that enables the site-specific removal of contamination from both sides of two dimensional membranes down to atomic-scale cleanliness. Further, mechanisms of re-contamination are discussed, finding surface-diffusion to be the major factor for contamination in electron microscopy. Finally the targeted, electron-beam assisted synthesis of a nanocrystalline graphene layer by supplying a precursor molecule to cleaned areas is demonstrated.

Authors with CRIS profile

Peter Schweizer Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Christian Dolle Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Daniela Dasler Sonderforschungsbereich 953/3 Synthetische Kohlenstoffallotrope Gonzalo Abellan Saez Lehrstuhl für Organische Chemie II Frank Hauke Lehrstuhl für Organische Chemie II Andreas Hirsch Lehrstuhl für Organische Chemie II Erdmann Spiecker Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

Additional Organisation(s)

Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM) Graduiertenkolleg 1896/2 In situ Mikroskopie mit Elektronen, Röntgenstrahlen und Rastersonden Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

Related research project(s)

In-situ Characterization of Nanomaterials with Electrons, X-rays/Neutrons and Scanning Probes (GRK 1896) Oct. 1, 2013 - Sept. 30, 2022 Aberration-Corrected High-Resolution and in situ Transmission Electron Microscopy of Carbon Allotropes and Related Device Structures (Z02) (SFB 953) SFB 953: Synthetic Carbon Allotropes (SFB 953) Jan. 1, 2012 - Jan. 1, 2015

How to cite

APA:

Schweizer, P., Dolle, C., Dasler, D., Abellán, G., Hauke, F., Hirsch, A., & Spiecker, E. (2020). Mechanical cleaning of graphene using in situ electron microscopy. Nature Communications, 11(1), 1743-. https://dx.doi.org/10.1038/s41467-020-15255-3

MLA:

Schweizer, Peter, et al. "Mechanical cleaning of graphene using in situ electron microscopy." Nature Communications 11.1 (2020): 1743-.

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