Evaluation of deep learning for semantic image segmentation in tool condition monitoring

Lutz B, Kißkalt D, Regulin D, Reisch R, Schiffler A, Franke J (2019)


Publication Type: Conference contribution, Conference Contribution

Publication year: 2019

Conference Proceedings Title: 2019 18th IEEE International Conference On Machine Learning And Applications (ICMLA)

Event location: Boca Raton, Florida US

DOI: 10.1109/ICMLA.2019.00321

Authors with CRIS profile

How to cite

APA:

Lutz, B., Kißkalt, D., Regulin, D., Reisch, R., Schiffler, A., & Franke, J. (2019). Evaluation of deep learning for semantic image segmentation in tool condition monitoring. In 2019 18th IEEE International Conference On Machine Learning And Applications (ICMLA). Boca Raton, Florida, US.

MLA:

Lutz, Benjamin, et al. "Evaluation of deep learning for semantic image segmentation in tool condition monitoring." Proceedings of the 2019 18th IEEE International Conference On Machine Learning And Applications (ICMLA), Boca Raton, Florida 2019.

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