Ludwig V, Akstaller B, Schuster M, Seifert M, Wolf A, Michel T, Anton G (2020)
Publication Type: Journal article
Publication year: 2020
Book Volume: 15
Article Number: P01010
Journal Issue: 1
DOI: 10.1088/1748-0221/15/01/P01010
A Talbot-Lau scanner enables fast grating-based X-ray phase-contrast and dark-field imaging of large samples. We present a fast and robust scanning method based on continuous phase-sampling during the usual scan process. For that purpose the source grating is moved back and forth during the whole image acquisition procedure. The scanning method needs no specific detuning of the interferometer. The acquired images are compared to the results of a standard phase-stepping procedure. We show that high quality images are obtained by this continuous phase-sampling scanning method. One main advantage of the method is its independence of the occurring moir'e pattern shape, thus enabling an optimal alignment of the interferometer. Furthermore, the method works with a priori unknown phase-step positions. To our knowledge, this is the first time a grating is moved continuously back and forth while also the sample is in linear motion during a continuous image acquisition in Talbot-Lau imaging.
APA:
Ludwig, V., Akstaller, B., Schuster, M., Seifert, M., Wolf, A., Michel, T., & Anton, G. (2020). A phase-sampling method for an X-ray Talbot-Lau scanner with continuous grating movement. Journal of Instrumentation, 15(1). https://doi.org/10.1088/1748-0221/15/01/P01010
MLA:
Ludwig, Veronika, et al. "A phase-sampling method for an X-ray Talbot-Lau scanner with continuous grating movement." Journal of Instrumentation 15.1 (2020).
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