Smart Manufacturing Traceability for Automotive E/E Systems enabled by Event-Driven Microservice Architecture

Kuhn M, Franke J (2020)


Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2020

Pages Range: 142-148

Event location: Cape Town ZA

DOI: 10.1109/ICMIMT49010.2020.9041240

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How to cite

APA:

Kuhn, M., & Franke, J. (2020). Smart Manufacturing Traceability for Automotive E/E Systems enabled by Event-Driven Microservice Architecture. In Proceedings of the 2020 IEEE 11th International Conference on Mechanical and Intelligent Manufacturing Technologies (pp. 142-148). Cape Town, ZA.

MLA:

Kuhn, Marlene, and Jörg Franke. "Smart Manufacturing Traceability for Automotive E/E Systems enabled by Event-Driven Microservice Architecture." Proceedings of the 2020 IEEE 11th International Conference on Mechanical and Intelligent Manufacturing Technologies, Cape Town 2020. 142-148.

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