Repairing Nanoparticle Surface Defects

Marino E, Kodger TE, Crisp R, Timmerman D, Macarthur KE, Heggen M, Schall P (2017)

Publication Status: Published

Publication Type: Journal article

Publication year: 2017

Journal

Angewandte Chemie International Edition Wiley

Publisher: WILEY-V C H VERLAG GMBH

Book Volume: 56

Pages Range: 13795-13799

Journal Issue: 44

DOI: 10.1002/anie.201705685

Abstract

Solar devices based on semiconductor nanoparticles require the use of conductive ligands; however, replacing the native, insulating ligands with conductive metal chalcogenide complexes introduces structural defects within the crystalline nanostructure that act as traps for charge carriers. We utilized atomically thin semiconductor nanoplatelets as a convenient platform for studying, both microscopically and spectroscopically, the development of defects during ligand exchange with the conductive ligands Na4SnS4 and (NH4)(4)Sn2S6. These defects can be repaired via mild chemical or thermal routes, through the addition of L-type ligands or wet annealing, respectively. This results in a higher-quality, conductive, colloidally stable nanomaterial that may be used as the active film in optoelectronic devices.

Authors with CRIS profile

Ryan Crisp Lehrstuhl für Chemistry of thin film materials

Involved external institutions

University of Amsterdam NL Netherlands (NL) Forschungszentrum Jülich / Research Centre Jülich (FZJ) DE Germany (DE)

How to cite

APA:

Marino, E., Kodger, T.E., Crisp, R., Timmerman, D., Macarthur, K.E., Heggen, M., & Schall, P. (2017). Repairing Nanoparticle Surface Defects. Angewandte Chemie International Edition, 56(44), 13795-13799. https://dx.doi.org/10.1002/anie.201705685

MLA:

Marino, Emanuele, et al. "Repairing Nanoparticle Surface Defects." Angewandte Chemie International Edition 56.44 (2017): 13795-13799.

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