Analysis of Digitized PV-Module/System Data for Failure Diagnosis

Buerhop C, Pickel T, Teubner J, Doll B, Hauch J, Brabec C (2019)


Publication Language: English

Publication Type: Conference contribution, Abstract of lecture

Publication year: 2019

Event location: Marseille FR

Abstract

EL-images disclose many failures in PV-modules, e. g. cell cracks. Their impact and the relevance of certain defect features on the performance during operation is not known. This study focused on the identification of defective power-relevant cells, their impact on the performance and the degradation. Therefore, pre-cracked, low-performing modules are integrated in a string and monitored on module level. As a result, a statistical analysis of EL-images identified the power-relevant cells. The power of defective modules is extremely sensitive to changing measurement conditions. Historical monitoring data and actual EL-images give evidence that so far no changes of the crack structures of fractured cells occurred. Strong seasonal impact is observed. However, the yield is rather stable during the inspection period

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How to cite

APA:

Buerhop, C., Pickel, T., Teubner, J., Doll, B., Hauch, J., & Brabec, C. (2019). Analysis of Digitized PV-Module/System Data for Failure Diagnosis. Paper presentation at 36th EU PVSEC 2019 Conference, Marseille, FR.

MLA:

Buerhop, Claudia, et al. "Analysis of Digitized PV-Module/System Data for Failure Diagnosis." Presented at 36th EU PVSEC 2019 Conference, Marseille 2019.

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