Späth A (2019)
Publication Type: Journal article, Review article
Publication year: 2019
Book Volume: 10
Journal Issue: 12
DOI: 10.3390/mi10120834
Focused soft X-ray beam induced deposition (FXBID) is a novel technique for direct-write nanofabrication of metallic nanostructures from metal organic precursor gases. It combines the established concepts of focused electron beam induced processing (FEBIP) and X-ray lithography (XRL). The present setup is based on a scanning transmission X-ray microscope (STXM) equipped with a gas flow cell to provide metal organic precursor molecules towards the intended deposition zone. Fundamentals of X-ray microscopy instrumentation and X-ray radiation chemistry relevant for FXBID development are presented in a comprehensive form. Recently published proof-of-concept studies on initial experiments on FXBID nanolithography are reviewed for an overview on current progress and proposed advances of nanofabrication performance. Potential applications and advantages of FXBID are discussed with respect to competing electron/ion based techniques.
APA:
Späth, A. (2019). Additive Nano-Lithography with Focused Soft X-rays: Basics, Challenges, and Opportunities. Micromachines, 10(12). https://dx.doi.org/10.3390/mi10120834
MLA:
Späth, Andreas. "Additive Nano-Lithography with Focused Soft X-rays: Basics, Challenges, and Opportunities." Micromachines 10.12 (2019).
BibTeX: Download