Characterizing the maximum number of layers in chemically exfoliated graphene

Szirmai P, Márkus BG, Chacón-Torres JC, Eckerlein P, Edelthalhammer K, Englert J, Mundloch U, Hirsch A, Hauke F, Náfrádi B, Forró L, Kramberger C, Pichler T, Simon F (2019)

Publication Type: Journal article

Publication year: 2019

Journal

Scientific Reports Nature Publishing Group: Open Access Journals - Option B

Book Volume: 9

Article Number: 19480

Journal Issue: 1

DOI: 10.1038/s41598-019-55784-6

Abstract

An efficient route to synthesize macroscopic amounts of graphene is highly desired and bulk characterization of such samples, in terms of the number of layers, is equally important. We present a Raman spectroscopy-based method to determine the typical upper limit of the number of graphene layers in chemically exfoliated graphene. We utilize a controlled vapour-phase potassium intercalation technique and identify a lightly doped stage, where the Raman modes of undoped and doped few-layer graphene flakes coexist. The spectra can be unambiguously distinguished from alkali doped graphite, and modeling with the typical upper limit of the layers yields an upper limit of flake thickness of five layers with a significant single-layer graphene content. Complementary statistical AFM measurements on individual few-layer graphene flakes find a consistent distribution of the layer numbers.

Authors with CRIS profile

Konstantin Edelthalhammer Lehrstuhl für Organische Chemie II Jan Englert Lehrstuhl für Organische Chemie II Udo Mundloch Lehrstuhl für Organische Chemie II Andreas Hirsch Lehrstuhl für Organische Chemie II Frank Hauke Lehrstuhl für Organische Chemie II

Involved external institutions

École Polytechnique Fédérale de Lausanne (EPFL) CH Switzerland (CH) Universität Wien / University of Vienna AT Austria (AT) Universidad de Investigación de Tecnología Experimental (Yachay Tech) EC Ecuador (EC) Budapest University of Technology and Economics (BME) / Budapesti Műszaki és Gazdaságtudományi Egyetem HU Hungary (HU)

How to cite

APA:

Szirmai, P., Márkus, B.G., Chacón-Torres, J.C., Eckerlein, P., Edelthalhammer, K., Englert, J.,... Simon, F. (2019). Characterizing the maximum number of layers in chemically exfoliated graphene. Scientific Reports, 9(1). https://dx.doi.org/10.1038/s41598-019-55784-6

MLA:

Szirmai, Péter, et al. "Characterizing the maximum number of layers in chemically exfoliated graphene." Scientific Reports 9.1 (2019).

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