Weakly Supervised Segmentation of Cracks on Solar Cells using Normalized Lp Norm

Mayr M, Hoffmann M, Maier A, Christlein V (2019)

Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2019

Pages Range: 1885 - 1889

Conference Proceedings Title: 2019 IEEE International Conference on Image Processing (ICIP)

Event location: Taipei

ISBN: 9781538662496

URI: https://www5.informatik.uni-erlangen.de/Forschung/Publikationen/2019/Mayr19-WSS.pdf

DOI: 10.1109/ICIP.2019.8803116

Abstract

Photovoltaic is one of the most important renewable energy sources for dealing with world-wide steadily increasing energy consumption. This raises the demand for fast and scalable automatic quality management during production and operation. However, the detection and segmentation of cracks on electroluminescence (EL) images of mono- or polycrystalline solar modules is a challenging task. In this work, we propose a weakly supervised learning strategy that only uses image-level annotations to obtain a method that is capable of segmenting cracks on EL images of solar cells. We use a modified ResNet-50 to derive a segmentation from network activation maps. We use defect classification as a surrogate
task to train the network. To this end, we apply normalized L_p normalization to aggregate the activation maps into single scores for classification. In addition, we provide a study how different parameterizations of the normalized L_p layer affect the segmentation performance. This approach shows promising results for the given task. However, we think that the method has the potential to solve other weakly supervised segmentation problems as well.

Authors with CRIS profile

Martin Mayr Lehrstuhl für Informatik 5 (Mustererkennung) Mathis Hoffmann Lehrstuhl für Informatik 5 (Mustererkennung) Andreas Maier Lehrstuhl für Informatik 5 (Mustererkennung) Vincent Christlein Lehrstuhl für Informatik 5 (Mustererkennung)

How to cite

APA:

Mayr, M., Hoffmann, M., Maier, A., & Christlein, V. (2019). Weakly Supervised Segmentation of Cracks on Solar Cells using Normalized Lp Norm. In IEEE (Eds.), 2019 IEEE International Conference on Image Processing (ICIP) (pp. 1885 - 1889). Taipei, TW.

MLA:

Mayr, Martin, et al. "Weakly Supervised Segmentation of Cracks on Solar Cells using Normalized Lp Norm." Proceedings of the 2019 IEEE International Conference on Image Processing, Taipei Ed. IEEE, 2019. 1885 - 1889.

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