Low Energy Nano Diffraction (LEND) – Bringing true Diffraction to SEM

Schweizer P, Denninger P, Dolle C, Rechberger S, Spiecker E (2019)


Publication Language: English

Publication Type: Journal article, Original article

Publication year: 2019

Journal

DOI: 10.1017/S1431927619002988

Authors with CRIS profile

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How to cite

APA:

Schweizer, P., Denninger, P., Dolle, C., Rechberger, S., & Spiecker, E. (2019). Low Energy Nano Diffraction (LEND) – Bringing true Diffraction to SEM. Microscopy and Microanalysis. https://doi.org/10.1017/S1431927619002988

MLA:

Schweizer, Peter, et al. "Low Energy Nano Diffraction (LEND) – Bringing true Diffraction to SEM." Microscopy and Microanalysis (2019).

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