Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy

Wu M, Tafel A, Hommelhoff P, Spiecker E (2019)

Publication Language: English

Publication Type: Journal article, Letter

Publication year: 2019

Journal

Microscopy and Microanalysis Cambridge University Press (CUP)

Book Volume: 25

Pages Range: 74-75

Conference Proceedings Title: Microscopy and Microanalysis

Event location: Portland, OR

Journal Issue: S2

DOI: 10.1017/S1431927619001107

Authors with CRIS profile

Mingjian Wu Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Alexander Tafel Lehrstuhl für Laserphysik Peter Hommelhoff Lehrstuhl für Laserphysik Erdmann Spiecker Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

Additional Organisation(s)

Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)

How to cite

APA:

Wu, M., Tafel, A., Hommelhoff, P., & Spiecker, E. (2019). Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 25(S2), 74-75. https://dx.doi.org/10.1017/S1431927619001107

MLA:

Wu, Mingjian, et al. "Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy." Microscopy and Microanalysis 25.S2 (2019): 74-75.

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