Fast Dot Correlation in Optical Metrology on GPGPUs

Seidler R, Schäfer A, Fey D (2011)

Publication Type: Conference contribution

Publication year: 2011

Publisher: CSREA Press

City/Town: Las Vegas

Book Volume: 1

Pages Range: 248-254

Edition: 1

Conference Proceedings Title: Proceedings of The 2011 International Conference on Parallel and Distributed Processing Technology and Applications

Event location: Las Vegas

ISBN: 1-60132-193-7

Authors with CRIS profile

Andreas Schäfer Lehrstuhl für Informatik 3 (Rechnerarchitektur) Dietmar Fey Lehrstuhl für Informatik 3 (Rechnerarchitektur)

How to cite

APA:

Seidler, R., Schäfer, A., & Fey, D. (2011). Fast Dot Correlation in Optical Metrology on GPGPUs. In Proceedings of The 2011 International Conference on Parallel and Distributed Processing Technology and Applications (pp. 248-254). Las Vegas: Las Vegas: CSREA Press.

MLA:

Seidler, Ralf, Andreas Schäfer, and Dietmar Fey. "Fast Dot Correlation in Optical Metrology on GPGPUs." Proceedings of the PDPTA 2011, Las Vegas Las Vegas: CSREA Press, 2011. 248-254.

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