Evaluation and quantification by electron back-scattering diffraction of the microsturcture of laser-crystallized silicon thin films
Christiansen S, Nerding M, Eßer G, Urmoneit U, Otto A, Strunk H (2001)
Publication Type: Conference contribution
Publication year: 2001
Conference Proceedings Title: Proceedings of the Microscopy of Semiconducting Materials XII Conference
Additional Organisation(s)
Involved external institutions
Max-Planck-Institut für die Physik des Lichts (MPL) / Max Planck Institute for the Science of Light
Germany (DE)
Bayerisches Laserzentrum gemeinnützige Forschungsgesellschaft mbH (BLZ)
Germany (DE)
Technische Universität Wien / Vienna University of Technology
Austria (AT)
Germany (DE)
Bayerisches Laserzentrum gemeinnützige Forschungsgesellschaft mbH (BLZ)
Germany (DE)
Technische Universität Wien / Vienna University of Technology
Austria (AT)
How to cite
APA:
Christiansen, S., Nerding, M., Eßer, G., Urmoneit, U., Otto, A., & Strunk, H. (2001). Evaluation and quantification by electron back-scattering diffraction of the microsturcture of laser-crystallized silicon thin films. In Proceedings of the Microscopy of Semiconducting Materials XII Conference.
MLA:
Christiansen, S., et al. "Evaluation and quantification by electron back-scattering diffraction of the microsturcture of laser-crystallized silicon thin films." Proceedings of the Proceedings of the Microscopy of Semiconducting Materials XII Conference 2001.
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