Reducing Hibernation Energy and Degradation in Bipolar ReRAM-Based Non-Volatile Processors

Biglari M, Lieske T, Fey D (2019)

Publication Language: English

Publication Type: Journal article

Publication year: 2019

Journal

IEEE Transactions on Nanotechnology Institute of Electrical and Electronics Engineers (IEEE)

DOI: 10.1109/TNANO.2019.2922363

Authors with CRIS profile

Mehrdad Biglari Lehrstuhl für Informatik 3 (Rechnerarchitektur) Tobias Lieske Lehrstuhl für Informatik 3 (Rechnerarchitektur) Dietmar Fey Lehrstuhl für Informatik 3 (Rechnerarchitektur)

How to cite

APA:

Biglari, M., Lieske, T., & Fey, D. (2019). Reducing Hibernation Energy and Degradation in Bipolar ReRAM-Based Non-Volatile Processors. IEEE Transactions on Nanotechnology. https://dx.doi.org/10.1109/TNANO.2019.2922363

MLA:

Biglari, Mehrdad, Tobias Lieske, and Dietmar Fey. "Reducing Hibernation Energy and Degradation in Bipolar ReRAM-Based Non-Volatile Processors." IEEE Transactions on Nanotechnology (2019).

BibTeX: Download