Technostress and the hierarchical levels of personality: A two-wave study with multiple data samples

Maier C, Laumer S, Wirth J, Weitzel T (2019)


Publication Language: English

Publication Type: Journal article, Original article

Publication year: 2019

Journal

Book Volume: Volume 28, Issue 5

Pages Range: 496-522

Journal Issue: 28

DOI: 10.1080/0960085X.2019.1614739

Abstract

Even though IS use has numerous benefits for users and organisations, such as improved user performance and greater productivity, an increasing number of users experience technostress. Since technostress can result in decreased user well-being, it is important to understand what leads users to perceive it. Recent technostress research points to the relationship between personality traits and the perception of technostress as a research gap. Given that personality traits are structured hierarchically, we study how and which levels of user personality influence the perception of technostress. In developing our research model, we select personality traits from the three hierarchical levels of personality: neuroticism, personal innovativeness in IT (PIIT), and IT mindfulness. The results of 2 two-wave studies analysing data collected in an organisational setting (sample 1) and through mTurk (sample 2) reveal that all three personality traits influence the perception of technostress, with IT mindfulness having the strongest impact. This study contributes by revealing that user personality and, primarily, IT mindfulness influence the perception of technostress. Additionally, our findings reveal an inverted u-curved influence of techno-stressors on user performance, deepening our understanding of how the perception of technostress influences user reactions.

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How to cite

APA:

Maier, C., Laumer, S., Wirth, J., & Weitzel, T. (2019). Technostress and the hierarchical levels of personality: A two-wave study with multiple data samples. European Journal of Information Systems, Volume 28, Issue 5(28), 496-522. https://dx.doi.org/10.1080/0960085X.2019.1614739

MLA:

Maier, Christian, et al. "Technostress and the hierarchical levels of personality: A two-wave study with multiple data samples." European Journal of Information Systems Volume 28, Issue 5.28 (2019): 496-522.

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