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Investigation of lanthanum contamination from a lanthanated tungsten ion source

Häublein V, Frey L, Ryssel H, Walser H (2002)

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Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2002

Publisher: Institute of Electrical and Electronics Engineers Inc.

Pages Range: 346-349

Article Number: 1258011

ISBN: 0780371550

DOI: 10.1109/IIT.2002.1258011

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How to cite

APA:

Häublein, V., Frey, L., Ryssel, H., & Walser, H. (2002). Investigation of lanthanum contamination from a lanthanated tungsten ion source. In Proceedings of the 2002 14th IEEE International Conference on Ion Implantation Technology, IIT 2002 (pp. 346-349). Institute of Electrical and Electronics Engineers Inc..

MLA:

Häublein, Volker, et al. "Investigation of lanthanum contamination from a lanthanated tungsten ion source." Proceedings of the 2002 14th IEEE International Conference on Ion Implantation Technology, IIT 2002 Institute of Electrical and Electronics Engineers Inc., 2002. 346-349.

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