Different ion implanted edge terminations for Schottky diodes on SiC

Weiss R, Frey L, Ryssel H (2002)

Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2002

Publisher: Institute of Electrical and Electronics Engineers Inc.

Pages Range: 139-142

Article Number: 1257958

ISBN: 0780371550

DOI: 10.1109/IIT.2002.1257958

Authors with CRIS profile

Lothar Frey Lehrstuhl für Elektronische Bauelemente Heiner Ryssel Technische Fakultät

How to cite

APA:

Weiss, R., Frey, L., & Ryssel, H. (2002). Different ion implanted edge terminations for Schottky diodes on SiC. In Proceedings of the 2002 14th IEEE International Conference on Ion Implantation Technology, IIT 2002 (pp. 139-142). Institute of Electrical and Electronics Engineers Inc..

MLA:

Weiss, R., Lothar Frey, and Heiner Ryssel. "Different ion implanted edge terminations for Schottky diodes on SiC." Proceedings of the 2002 14th IEEE International Conference on Ion Implantation Technology, IIT 2002 Institute of Electrical and Electronics Engineers Inc., 2002. 139-142.

BibTeX: Download