In-depth damage distribution by scanning probe methods in targets irradiated with 200 MeV ions

Biró L, Gyulai J, Havancsák K, Didyk A, Frey L, Ryssel H (1997)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 1997

Journal

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Elsevier

Publisher: Elsevier

Pages Range: 32-37

DOI: 10.1016/S0168-583X(96)01106-8

Authors with CRIS profile

Lothar Frey Lehrstuhl für Elektronische Bauelemente Heiner Ryssel Technische Fakultät

How to cite

APA:

Biró, L., Gyulai, J., Havancsák, K., Didyk, A., Frey, L., & Ryssel, H. (1997). In-depth damage distribution by scanning probe methods in targets irradiated with 200 MeV ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 32-37. https://dx.doi.org/10.1016/S0168-583X(96)01106-8

MLA:

Biró, L., et al. "In-depth damage distribution by scanning probe methods in targets irradiated with 200 MeV ions." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms (1997): 32-37.

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