Calibration of the Bistatic TanDEM-X Interferometer

Bachmann M, Gonzalez JH, Krieger G, Schwerdt M, Antony JW, De Zan F (2012)

Publication Type: Conference contribution

Publication year: 2012

Publisher: VDE Verlag GmbH

Edited Volumes: Proceedings of the European Conference on Synthetic Aperture Radar, EUSAR

Series: Proceedings of the European Conference on Synthetic Aperture Radar (EUSAR)

Book Volume: 2012-April

Pages Range: 1-4

Conference Proceedings Title: European Conference on Synthetic Aperture Radar (EUSAR)

ISBN: 9783800734047

URI: https://elib.dlr.de/72477/

Abstract

The paper describes the Calibration of Baseline, Instrument Delays and the Absolute Height of the RawDEMs for the TanDEM-X Global DEM in terms of bi-static and interferometric aspects.

Authors with CRIS profile

Gerhard Krieger

Additional Organisation(s)

Professur für Kognitive Radarsysteme für die Fernerkundung

Involved external institutions

Deutsches Zentrum für Luft- und Raumfahrt e.V. (DLR) / German Aerospace Center DE Germany (DE)

How to cite

APA:

Bachmann, M., Gonzalez, J.H., Krieger, G., Schwerdt, M., Antony, J.W., & De Zan, F. (2012). Calibration of the Bistatic TanDEM-X Interferometer. In European Conference on Synthetic Aperture Radar (EUSAR) (pp. 1-4). VDE Verlag GmbH.

MLA:

Bachmann, Markus, et al. "Calibration of the Bistatic TanDEM-X Interferometer." Proceedings of the 9th European Conference on Synthetic Aperture Radar, EUSAR 2012 VDE Verlag GmbH, 2012. 1-4.

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