TanDEM-X: The New Global DEM Takes Shape
Zink M, Bachmann M, Braeutigam B, Fritz T, Hajnsek I, Krieger G, Moreira A, Wessel B (2014)
Publication Type: Journal article
Publication year: 2014
Journal
IEEE Geoscience and Remote Sensing Magazine
Institute of Electrical and Electronics Engineers (IEEE)
Publisher: IEEE - Institute of Electrical and Electronics Engineers
Book Volume: 2
Pages Range: 8-23
Journal Issue: 2
URI: https://elib.dlr.de/91378/
DOI: 10.1109/MGRS.2014.2318895
Abstract
TanDEM-X (TerraSAR-X add-on for Digital Elevation Measurements) is an innovative formation flying radar mission that opens a new era in spaceborne radar remote sensing. The primary objective is the acquisition of a global Digital Elevation Model (DEM) with unprecedented accuracy (12 m horizontal resolution and 2 m relative height accuracy). This goal is achieved by extending the TerraSAR-X synthetic aperture radar (SAR) mission by a second, TerraSAR-X like satellite TanDEM-X (TDX) flying in close formation with TerraSAR-X (TSX). The resulting large single-pass SAR interferometer features flexible baseline selection enabling the acquisition of highly accurate cross-track interferograms not impacted by temporal decorrelation and atmospheric disturbances. Beyond the global DEM, several secondary mission objectives based on alongtrack interferometry as well as new bistatic and multistatic SAR techniques have been defined. © 2013 IEEE.
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Germany (DE)How to cite
APA:
Zink, M., Bachmann, M., Braeutigam, B., Fritz, T., Hajnsek, I., Krieger, G.,... Wessel, B. (2014). TanDEM-X: The New Global DEM Takes Shape. IEEE Geoscience and Remote Sensing Magazine, 2(2), 8-23. https://dx.doi.org/10.1109/MGRS.2014.2318895
MLA:
Zink, Manfred, et al. "TanDEM-X: The New Global DEM Takes Shape." IEEE Geoscience and Remote Sensing Magazine 2.2 (2014): 8-23.
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