First results on laboratory nano-CT with a needle reflection target and an adapted toolchain

Stahlhut P, Dremel K, Dittmann J, Engel JM, Zabler S, Hoelzing A, Hanke R (2016)


Publication Type: Journal article

Publication year: 2016

Journal

Book Volume: 9967

Article Number: 99670I

DOI: 10.1117/12.2240561

Abstract

Recently, we introduced a nano Computed Tomography (nano-CT) system based on a customized JEOL scanning electron microscope applying the principle of shadow microscopy and yielding a spatial resolution of approximately 3000lp/mm. The system has been upgraded and now comprises a photon counting PIXIRAD-2 detector as well as a customized nano-positioning stage for object and electron target. The latter is a tungsten needle with a tip radius of 100nm produced by electrochemical etching. Here we present for the first time nano-CT volume images of microstructures within an AlCu29 sample recorded by the upgraded system (XRM-II). The quality of the iteratively reconstructed and regularized volumes is assessed by means of detail visibility and line spread. We found the spatial resolution to be at least 300nm. The image processing chain, in particular geometric misalignment correction is of critical importance for a successful nano-CT measurement with the XRM-II.

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How to cite

APA:

Stahlhut, P., Dremel, K., Dittmann, J., Engel, J.M., Zabler, S., Hoelzing, A., & Hanke, R. (2016). First results on laboratory nano-CT with a needle reflection target and an adapted toolchain. Proceedings of SPIE, 9967. https://dx.doi.org/10.1117/12.2240561

MLA:

Stahlhut, P., et al. "First results on laboratory nano-CT with a needle reflection target and an adapted toolchain." Proceedings of SPIE 9967 (2016).

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