Lifetime and Degradation of Pre-damaged PV-Modules - Field study and lab testing

Buerhop C, Wirsching S, Gehre S, Pickel T, Winkler T, Bemm A, Mergheim J, Camus C, Brabec C, Hauch J (2017)

Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2017

Journal

Conference Record of the IEEE Photovoltaic Specialists Conference Institute of Electrical and Electronics Engineers

Pages Range: 3500-3505

Conference Proceedings Title: Conference record of the IEEE Photovoltaic Specialists Conference

Event location: Washington, DC US

Abstract

The presence of pre-cracked PV-modules in modern PV-plants is well-known. The evolution and actual impact of the cracks on electrical yield under real operation conditions is not yet understood but of great relevance. Established standards cannot reveal the relevant effects. Therefore, a unique threefold analysis is applied: 1) field exposure, 2) using a new accelerated loading test, and 3) Finite Elements (FEM) simulations. For the first time, we present comparative Electroluminescence (EL-) images recorded in the field and during load testing. Crack growth is studied in terms of the monitored weather conditions and the applied load simulating static snow and wind loads.

Authors with CRIS profile

Sven Wirsching Chair of Engineering Design Julia Mergheim
Christoph Brabec Institute Materials for Electronics and Energy Technology (i-MEET)

Involved external institutions

Bayerisches Zentrum für Angewandte Energieforschung e.V. (ZAE Bayern) DE Germany (DE) Allianz Risk Consulting GmbH, AZT DE Germany (DE)

How to cite

APA:

Buerhop, C., Wirsching, S., Gehre, S., Pickel, T., Winkler, T., Bemm, A.,... Hauch, J. (2017). Lifetime and Degradation of Pre-damaged PV-Modules - Field study and lab testing. In IEEE (Eds.), Conference record of the IEEE Photovoltaic Specialists Conference (pp. 3500-3505). Washington, DC, US.

MLA:

Buerhop, Claudia, et al. "Lifetime and Degradation of Pre-damaged PV-Modules - Field study and lab testing." Proceedings of the 44th Photovoltaic Specialist Conference (PVSC), Washington, DC Ed. IEEE, 2017. 3500-3505.

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