Eder K, Felfer P, Gault B, Ceguerra AV, La Fontaine A, Masters AF, Maschmeyer T, Cairney JM (2017)
Publication Status: Published
Publication Type: Journal article
Publication year: 2017
Publisher: AMER CHEMICAL SOC
Book Volume: 33
Pages Range: 9573-9581
Journal Issue: 38
DOI: 10.1021/acs.langmuir.7b01820
Atom probe tomography was used to analyze self assembled monolayers of thiophene on different surfaces, including tungsten, platinum, and aluminum, where the tungsten was examined in both pristine and oxidized forms. A glovebag with controlled atmospheres was used to alter the level of oxidation for tungsten. It was shown that different substrates lead to substantial changes in the way thiophene adsorbs on the surface. Furthermore, the oxidation of the surface strongly influenced the adsorption behavior of the thiophene molecules, leading to clear differences in the amounts and compositions of field evaporated ions and molecular ions.
APA:
Eder, K., Felfer, P., Gault, B., Ceguerra, A.V., La Fontaine, A., Masters, A.F.,... Cairney, J.M. (2017). A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers. Langmuir, 33(38), 9573-9581. https://doi.org/10.1021/acs.langmuir.7b01820
MLA:
Eder, Katja, et al. "A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers." Langmuir 33.38 (2017): 9573-9581.
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