Advanced concentration analysis of atom probe tomography data: Local proximity histograms and pseudo-2D concentration maps

Felfer P, Cairney J (2018)

Publication Status: Published

Publication Type: Journal article

Publication year: 2018

Journal

Ultramicroscopy Elsevier

Publisher: ELSEVIER SCIENCE BV

Book Volume: 189

Pages Range: 61-64

DOI: 10.1016/j.ultramic.2018.03.011

Abstract

Analysing the distribution of selected chemical elements with respect to interfaces is one of the most common tasks in data mining in atom probe tomography. This can be represented by 1D concentration profiles, 2D concentration maps or proximity histograms, which represent concentration, density etc. of selected species as a function of the distance from a reference surface/interface. These are some of the most useful tools for the analysis of solute distributions in atom probe data. In this paper, we present extensions to the proximity histogram in the form of 'local' proximity histograms, calculated for selected parts of a surface, and pseudo-2D concentration maps, which are 2D concentration maps calculated on non-flat surfaces. This way, local concentration changes at interfaces or and other structures can be assessed more effectively. (C) 2018 Elsevier B.V. All rights reserved.

Authors with CRIS profile

Peter Felfer Professur für Atom Probe Tomography

Additional Organisation(s)

Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM) Professur für Atom Probe Tomography Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)

Related research project(s)

EAM CENCEM APT/Raster Jan. 1, 2019 - Jan. 1, 2022

Involved external institutions

University of Sydney (USYD) AU Australia (AU)

How to cite

APA:

Felfer, P., & Cairney, J. (2018). Advanced concentration analysis of atom probe tomography data: Local proximity histograms and pseudo-2D concentration maps. Ultramicroscopy, 189, 61-64. https://doi.org/10.1016/j.ultramic.2018.03.011

MLA:

Felfer, Peter, and Julie Cairney. "Advanced concentration analysis of atom probe tomography data: Local proximity histograms and pseudo-2D concentration maps." Ultramicroscopy 189 (2018): 61-64.

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