Time-dependent deformation behavior of freestanding and SiNx-supported gold thin films investigated by bulge tests

Beitrag in einer Fachzeitschrift


Details zur Publikation

Autorinnen und Autoren: Merle B, Cassel D, Göken M
Zeitschrift: Journal of Materials Research
Verlag: CAMBRIDGE UNIV PRESS
Jahr der Veröffentlichung: 2015
Band: 30
Heftnummer: 14
Seitenbereich: 2161-2169
ISSN: 0884-2914


Abstract

A novel strain-rate jump method was developed for the plane-strain bulge test and used to investigate the time-dependent deformation behavior of gold thin films in the thickness range 100-400 nm. The experimental method is based on an abrupt variation of the pressurization rate. The evaluated strain-rate sensitivity was found to be five times higher for films in freestanding condition (m = 0.094) than for films tested on a SiNx substrate (m = 0.020). Bulge creep tests confirmed this increased time-dependence. The observation of the surface of the freestanding films after the creep tests provided evidence of apparent grain boundary sliding taking place next to intragranular plastic deformation. The out-of-plane deformation was presumably favored by the columnar microstructure of the samples, with grains extending between both free surfaces. In the case of SiNx-supported films, grain boundary sliding was prevented by the good adhesion of gold to the SiNx substrate.


FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Göken, Mathias Prof. Dr.
Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)
Merle, Benoit PD Dr. habil.
Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)


Zusätzliche Organisationseinheit(en)
Exzellenz-Cluster Engineering of Advanced Materials
Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)


Einrichtungen weiterer Autorinnen und Autoren

Fachhochschule Kaiserslautern - University of Applied Sciences


Forschungsbereiche

A2 Nanoanalysis and Microscopy
Exzellenz-Cluster Engineering of Advanced Materials


Zitierweisen

APA:
Merle, B., Cassel, D., & Göken, M. (2015). Time-dependent deformation behavior of freestanding and SiNx-supported gold thin films investigated by bulge tests. Journal of Materials Research, 30(14), 2161-2169. https://dx.doi.org/10.1557/jmr.2015.184

MLA:
Merle, Benoit, Detlev Cassel, and Mathias Göken. "Time-dependent deformation behavior of freestanding and SiNx-supported gold thin films investigated by bulge tests." Journal of Materials Research 30.14 (2015): 2161-2169.

BibTeX: 

Zuletzt aktualisiert 2019-28-05 um 13:46