Time-dependent deformation behavior of freestanding and SiNx-supported gold thin films investigated by bulge tests

Merle B, Cassel D, Göken M (2015)


Publication Status: Published

Publication Type: Journal article

Publication year: 2015

Journal

Publisher: CAMBRIDGE UNIV PRESS

Book Volume: 30

Pages Range: 2161-2169

Journal Issue: 14

URI: https://opus4.kobv.de/opus4-fau/files/7997/Merle_time-dependent.pdf

DOI: 10.1557/jmr.2015.184

Abstract

A novel strain-rate jump method was developed for the plane-strain bulge test and used to investigate the time-dependent deformation behavior of gold thin films in the thickness range 100-400 nm. The experimental method is based on an abrupt variation of the pressurization rate. The evaluated strain-rate sensitivity was found to be five times higher for films in freestanding condition (m = 0.094) than for films tested on a SiNx substrate (m = 0.020). Bulge creep tests confirmed this increased time-dependence. The observation of the surface of the freestanding films after the creep tests provided evidence of apparent grain boundary sliding taking place next to intragranular plastic deformation. The out-of-plane deformation was presumably favored by the columnar microstructure of the samples, with grains extending between both free surfaces. In the case of SiNx-supported films, grain boundary sliding was prevented by the good adhesion of gold to the SiNx substrate.

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APA:

Merle, B., Cassel, D., & Göken, M. (2015). Time-dependent deformation behavior of freestanding and SiNx-supported gold thin films investigated by bulge tests. Journal of Materials Research, 30(14), 2161-2169. https://dx.doi.org/10.1557/jmr.2015.184

MLA:

Merle, Benoit, Detlev Cassel, and Mathias Göken. "Time-dependent deformation behavior of freestanding and SiNx-supported gold thin films investigated by bulge tests." Journal of Materials Research 30.14 (2015): 2161-2169.

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