Flexible sample cell for real-time GISAXS, GIWAXS and XRR: design and construction

Berlinghof M, Bär C, Haas D, Bertram F, Langner S, Osvet A, Chumakov A, Will J, Schindler T, Zech T, Brabec C, Unruh T (2018)

Publication Status: Published

Publication Type: Journal article

Publication year: 2018

Journal

Journal of Synchrotron Radiation International Union of Crystallography

Publisher: INT UNION CRYSTALLOGRAPHY

Book Volume: 25

Pages Range: 1664-1672

DOI: 10.1107/S1600577518013218

Abstract

Since the properties of functional materials are highly dependent on their specific structure, and since the structural changes, for example during crystallization, induced by coating and annealing processes are significant, the study of structure and its formation is of interest for fundamental and applied science. However, structure analysis is often limited to ex situ determination of final states due to the lack of specialized sample cells that enable real-time investigations. The lack of such cells is mainly due to their fairly complex design and geometrical restrictions defined by the beamline setups. To overcome this obstacle, an advanced sample cell has been designed and constructed; it combines automated doctor blading, solvent vapor annealing and sample hydration with real-time grazing-incidence wide- and small-angle scattering (GIWAXS/GISAXS) and X-ray reflectivity (XRR). The sample cell has limited spatial requirements and is therefore widely usable at beamlines and laboratory-scale instruments. The cell is fully automatized and remains portable, including the necessary electronics. In addition, the cell can be used by interested scientists in cooperation with the Institute for Crystallography and Structural Physics and is expandable with regard to optical secondary probes. Exemplary research studies are presented, in the form of coating of P3HT:PC61PM thin films, solvent vapor annealing of DRCN5T:PC71BM thin films, and hydration of supported phospholipid multilayers, to demonstrate the capabilities of the in situ cell.

Authors with CRIS profile

Marvin Berlinghof Professur für Nanomaterialcharakterisierung (Streumethoden) Christian Bär Professur für Nanomaterialcharakterisierung (Streumethoden) Stefan Langner Institute Materials for Electronics and Energy Technology (i-MEET) (i-MEET) Andres Osvet Institute Materials for Electronics and Energy Technology (i-MEET) (i-MEET) Johannes Will Lehrstuhl für Kristallographie und Strukturphysik (ICSP) Torben Schindler Lehrstuhl für Kristallographie und Strukturphysik (ICSP) Tobias Zech Lehrstuhl für Kristallographie und Strukturphysik (ICSP) Christoph Brabec Institute Materials for Electronics and Energy Technology (i-MEET) (i-MEET) Tobias Unruh Professur für Nanomaterialcharakterisierung (Streumethoden)

Additional Organisation(s)

Graduiertenkolleg 1896/2 In situ Mikroskopie mit Elektronen, Röntgenstrahlen und Rastersonden Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)

Involved external institutions

European Synchrotron Radiation Facility (ESRF) FR France (FR) Deutsches Elektronen-Synchrotron DESY DE Germany (DE)

How to cite

APA:

Berlinghof, M., Bär, C., Haas, D., Bertram, F., Langner, S., Osvet, A.,... Unruh, T. (2018). Flexible sample cell for real-time GISAXS, GIWAXS and XRR: design and construction. Journal of Synchrotron Radiation, 25, 1664-1672. https://doi.org/10.1107/S1600577518013218

MLA:

Berlinghof, Marvin, et al. "Flexible sample cell for real-time GISAXS, GIWAXS and XRR: design and construction." Journal of Synchrotron Radiation 25 (2018): 1664-1672.

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