Defect densities inside the conductive filament of RRAMs

Robertson J, Gillen R (2013)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2013

Journal

Microelectronic Engineering Elsevier

Book Volume: 109

Pages Range: 208-210

DOI: 10.1016/j.mee.2013.03.010

Authors with CRIS profile

Roland Gillen Lehrstuhl für Experimentalphysik

Involved external institutions

University of Cambridge GB United Kingdom (GB)

How to cite

APA:

Robertson, J., & Gillen, R. (2013). Defect densities inside the conductive filament of RRAMs. Microelectronic Engineering, 109, 208-210. https://dx.doi.org/10.1016/j.mee.2013.03.010

MLA:

Robertson, John, and Roland Gillen. "Defect densities inside the conductive filament of RRAMs." Microelectronic Engineering 109 (2013): 208-210.

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