Native point defects of semiconducting layered Bi2O2Se

Journal article
(Original article)


Publication Details

Author(s): Li H, Xu X, Zhang Y, Gillen R, Shi L, Robertson J
Journal: Scientific Reports
Publisher: Nature Publishing Group
Publication year: 2018
Volume: 8
Journal issue: 1
ISSN: 2045-2322


FAU Authors / FAU Editors

Gillen, Roland
Lehrstuhl für Experimentalphysik


How to cite

APA:
Li, H., Xu, X., Zhang, Y., Gillen, R., Shi, L., & Robertson, J. (2018). Native point defects of semiconducting layered Bi2O2Se. Scientific Reports, 8(1). https://dx.doi.org/10.1038/s41598-018-29385-8

MLA:
Li, Huanglong, et al. "Native point defects of semiconducting layered Bi2O2Se." Scientific Reports 8.1 (2018).

BibTeX: 

Last updated on 2019-28-02 at 06:13