Analysis of super-resolution via 3D structured illumination intensity correlation microscopy

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Details zur Publikation

Autor(en): Classen A, von Zanthier J, Agarwal GS
Zeitschrift: Optics Express
Jahr der Veröffentlichung: 2018
Band: 26
Heftnummer: 21
Seitenbereich: 27492-27503
ISSN: 1094-4087
Sprache: Englisch


Intensity correlation microscopy (ICM), which is prominently known through antibunching microscopy or super-resolution optical fluctuation imaging (SOFI), provides super-resolution through a correlation analysis of antibunching of independent quantum emitters or temporal fluctuations of blinking fluorophores. For correlation order m the PSF in the signal is effectively taken to the mth power, and is thus directly shrunk by the factor root m. Combined with deconvolution, a close to linear resolution improvement of factor m can be obtained. Yet, analysis of high correlation orders is challenging, which limits the achievable resolutions. Here we propose to use three dimensional structured illumination along with mth-order correlation analysis to obtain an enhanced scaling of up to m + m = 2m. Including the stokes shift or plasmonic sub-wavelength illumination enhancements beyond 2m can be achieved. Hence, resolutions far below the diffraction limit and with already low correlation orders in full 3D imaging, can potentially be achieved. Since ICM operates in the linear regime our approach may be particularly promising for enhancing the resolution in biological imaging at low illumination levels. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

FAU-Autoren / FAU-Herausgeber

Classen, Anton
Professur für Experimentalphysik
von Zanthier, Joachim Prof. Dr.
Professur für Experimentalphysik

Autor(en) der externen Einrichtung(en)
Texas A&M University


Classen, A., von Zanthier, J., & Agarwal, G.S. (2018). Analysis of super-resolution via 3D structured illumination intensity correlation microscopy. Optics Express, 26(21), 27492-27503.

Classen, Anton, Joachim von Zanthier, and G. S. Agarwal. "Analysis of super-resolution via 3D structured illumination intensity correlation microscopy." Optics Express 26.21 (2018): 27492-27503.


Zuletzt aktualisiert 2018-28-10 um 09:10